workshop overview   General Information>Overview
 
 

The workshop on RTL and high level testing (WRTLT) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.

Below is a link to submit the manuscript in the easychair:
https://easychair.org/conferences/?conf=wrtlt2018

Online registration of WRTLT 2018 is open!  Please use the following link:
https://www.regonline.com/wrtlt18

Original papers on, but not limited to, the following areas are invited.

  • RTL fault modeling, RTL ATPG, RTL DFT, RTL BIST
  • High-level/behavior fault modeling, testing and synthesis for testability
  • Functional fault modeling and test bench generation
  • 3D IC testing
  • SoC/NoC testing, test scheduling, core-based testing, interconnect testing
  • Dependable SoC: design for dependability, self-repair techniques, fault-tolerant SoCs
  • Microprocessor testing and design verification
  • Low power testing and Test compression
  • Hardware Trojan detection and secure testing

  • Authors are invited to submit paper proposals for presentation at the workshop. The proposal may be an extended summary (1,000 words) or a full paper (4-6 pages, two columns). The submission should include: title, full name and affiliation of all authors, 50 words abstract, keywords and the name of contact author, in a standard IEEE two-column format. The submission will be considered evidence that upon acceptance the author(s) will present the paper at the workshop. Digest of Papers will be handed out at the workshop. All submissions are now to be made electronically through the EasyChair conference system.  

    Further Information

    Sponsored By
    IEEE Computer Society, 

    IEEE Council on Electronic Design

     Automation,

    Test Technology Technical Council,

    Hefei University of Technology,

    Institute of Computing Technology, 

    CAS,

    in cooperation with
    Chinese Computer Federation,
    Fault-Tolerant Computing Technical Committee.

    HISEMI

    hficc

    ARM

    ARM ACCELERATOR

    Hefei Hi-Tech Industrial Development Zone

    cadence

    NATIONAL INSTRUMENTS

    Moore Elite

    Moore Elite